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Optical Profilers	Model	Thickness Range	Field-of-View	Spatial Sampling
Profilm3D	Step-height and surface roughness measurements Features: VIS and PSI measurement capabilities. 100mm of motorized X, Y, and Z translation. Tip/Tilt Stage. * With 10X objective lens.
	Profilm3D	0.001-500 µm	2.0 x 1.7 mm *	0.88 µm *

Single-Spot Measurements	Model	Thickness Range	Wavelength Range	Standard Spot Size
F3-CP	Reflectance measurement of flat or curved samples Features: Compact, low-cost, non-UV systems have 40k-hour light source. * Thickness measurement capability is optional.
	F3-CP	0.015-70 µm *	380-1050 nm	100 μm
F10-AR	Reflectance measurement of large flat or curved samples Features: Handheld probe for large samples and maximum versatility. * Thickness measurement capability is optional.
	F10-AR	0.2-15 µm *	380-1050 nm	100 μm
	F10-AR-EXR	0.2-30 µm *	380-1700 nm	100 μm
	F10-AR-NIR	0.5-30 µm *	950-1700 nm	100 μm
	F10-AR-UV	0.1-15 µm *	190-1100 nm	100 μm
	F10-AR-UVX	0.1-30 µm *	190-1700 nm	100 μm
F10-ARc	Reflectance measurement of AR coatings Features: Includes color and reflectance alarms and hardcoat correction. * Thickness measurement capability is optional.
	F10-ARc	0.2-15 µm *	380-1050 nm	100 μm
F10-HC	Reflectance measurement of AR coatings Features: Handheld probe for large samples and maximum versatility. * Thickness measurement
	F10-HC	0.05-70 µm *	380-1050 nm	200 μm

Single-Spot Measurements	Model	Thickness Range	Wavelength Range	Standard Spot Size
F40	Microscope-based thin-film measurement system Features: Attach to a microscope. Very small spot size.
	F40	0.02-20 µm	400-850 nm	1 μm
	F40-EXR	0.02-40 µm	400-1700 nm	1 μm
	F40-NIR	0.04-40 µm	950-1700 nm	1 μm
	F40-UV	0.004-40 µm	190-1100 nm	7 μm
	F40-UVX	0.004-40 µm	190-1700 nm	7 μm